Poster programme


P:01 Crystallography, electron microscopy and functional evolution of atomically thin confined nanowires
Jeremy Sloan, University of Warwick, UK


P:02 Scanning transmission electron microscopy of beam sensitive Quartz
Antonius van Helvoort, NTNU, Department of Physics, Norway


P:03 3D precession diffraction tomography in TEM:  Solving structures of beam sensitive pharmaceuticals with new generation direct detection pixelated detectors 
Alan C Robins, NanoMEGAS SPRL, Belgium 


P:04 Gatan K2 direct detection sensors move from Cryo imaging, to low dose imaging of beam sensitive materials specimen.
Neil Wilkinson, Gatan UK, UK


P:05 Optimizing liquid cell transmission electron microscopy for energy dispersive x-ray spectroscopy
Jordan Moering, Protochips, USA


P:06 Low energy X-ray spectrometry of beam sensitive garnet electrolytes using a windowless EDS detector
James Sagar, Oxford Instruments, UK


P:07 In situ catalyst characterization using scanning transmission electron microscopy and X-ray absorption spectroscopy at one atmosphere and elevated temperature
Matt Lindley, The University of Manchester, UK


P:08 Atomic scale imaging of reversible ring cyclization in graphene nanoconstrictions
Jakyung Lee, University of Oxford, UK


P:09 Beam exposure dependence of EELS-based Ce oxidation state characterisation
Dung-Trung Tran, Johnson Matthey Technology Centre, UK


P:10 Direct observation of defect evolution in 2D single layer tungsten diselenide by low voltage high resolution transmission electron microscopy
Yueliang Li, Ulm University, Germany


P:11 Diffuse contrast in neutral helium atom microscopy
Sam Lambrick, University of Cambridge, UK


P:12 Increasing electron micrograph signal-to-noise ratios using deep learning
Jeffrey Ede, University of Warwick, UK


P:13 Using cryo-mono-EELS to accurately measure the oxidation state of environmentally relevant iron oxide minerals
Helen Freeman, GFZ German Research Centre for Geosciences, Germany


P:14 Quantitative electron beam damage study of beam sensitive materials 
Eu Pin Tien, The University of Manchester, UK


P:15 Atomic and electronic structure of two-dimensional Mo1-xWxS₂ semiconductor alloys
Xue Xia, University of Warwick, UK


P:16 III-V nanowires with stable defects at high temperatures
James Gott, University of Warwick, UK


P:17 In situ transmission electron microscopy of domain switching in ferroelectric films
Jonathan Peters, University of Warwick, UK


P:18 In-situ (E)SEM ‘Freeze-Drying’ & High Resolution Imaging of Polymer Lattices and their film formation mechanism
Marzena Tkaczyk, University of Oxford, UK


P:19 Microstructure investigation and mechanical properties of bulk, nanocrystalline Fe-based alloys obtained by rapid quenching technique 
Marzena Tkaczyk, University of Oxford, UK


P:20 Cold Chocolate under stress: An alternative approach to study high-rate behaviour in polymers
Rhiannon Heard, University of Oxford, UK


P:21 Micromechanics of pharmaceutics – a novel in-situ tensile test 
Rhiannon Heard, University of Oxford, UK


P:22 Microdamage observations in rat tail tendons
Kalin Dragnevski, University of Oxford, UK


P:23 Size dependent electron beam induced structural modifications in silver nanoparticles
David Rickerby, European Commission Joint Research Centre, Italy


P:24 Studies of carbon-supported Co₃O₄ nanocrystals using aberration-corrected exit wavefunction reconstruction
Ofentse Makgae, University of Oxford, UK


P:25 MAX phases for future fission and fusion environments
Max Rigby, The University of Manchester, UK


P:26 Using transmission electron microscopy to investigate the relationship between platinum nanoparticles structure and electrocatalytic efficiency
Haytham Hussein, University of Warwick, UK


P:27 Electron microscopy for analysis of temperature stable relaxors
Teresa Roncal-Herrero, University of Leeds, UK


P:28 Reduction of systematic and excessive noise in charge-coupled device measurements
Tobias Heil, Max Planck Institute of Colloids and Interfaces, Germany


P:29 Atomic resolution STEM imaging of defects in air-sensitive 2D materials
David Hopkinson, The University of Manchester, UK


P:30 Assessing lamellae thickness during FIB milling with Monte Carlo modelling 
Evan Tillotson, The University of Manchester, UK


P:31 Optical and terahertz properties of structurally-modified carbon nanotubes: photoconductivity of thin films
Maria Burdanova, University of Warwick, UK


P:32 Atomic resolution imaging of 2D materials in controlled atmospheres
Gregor Leuthner, University of Vienna, Austria


P:33 Direct Observation of Intrinsic Twin Domains in Tetragonal CH3NH3PbI3
Mathias Uller Rothmann, University of Oxford, UK


P:34 Growth and characterization of ultrathin indium and indium-oxide on graphene
Georg Zagler, University of Vienna, Austria


P:35 Modelling effects of electron-beam irradiation
Edward Mortimer, University of Nottingham, UK


P:36 Model-based quantification of ADF STEM images in the presence of crystal tilt
Annelies De wael, University of Antwerp, Belgium


P:37 Atomic resolution electron tomography of nanoparticles on tungsten tips
Timothy Poon, University of Birmingham, UK


P:38 STEM imaging of Zeolite ZSM5 with Cu Cations
Emily Brooke, Johnson Matthey, UK


P:39 Atomically sharp interlayer stacking shifts at anti-phase grain boundaries in overlapping MoS2 secondary layers
Si Zhou, University of Oxford, UK


P:40 HRTEM of alkali-halide cluster ions deposited on graphene using
electrospray ion-beam deposition
Nilesh Vats, Max-Planck-Institute for Solid State Research, Germany


P:41 (Flash poster) Large inversion domains evolvement in monolayer MoS2 by in-situ heating
Jun Chen, University of Oxford, UK


P:42 (Flash poster) Atomic electric fields in monolayer MoS₂
Yi Wen, University of Oxford, UK


P:43 (Flash poster) Cryo-analytical STEM for characterisation of nanoparticle dispersions in aqueous media
Martha Ilett, University of Leeds, UK


P:44 (Flash poster) Quantitative compositional analysis by electron diffraction and theoretical simulation
Yu-Jen Chou, University of Oxford, UK


P:45 (Flash poster) Estimating sub-surface biological activity through the abundance of superparamagnetic grains in a continental ophiolite complex: A multiscale correlative study
Joshua Einsle, University of Cambridge, UK


P:46 (Flash poster) Benefits and limitations of off-axis holography for bio-imaging in transmission microscopy
Christopher Edgcombe, University of Cambridge, UK


P:47 (Flash poster) Python scripting to enhance in situ experimentation in SEM
Daniel Phifer, Thermo Fisher Scientific, UK


P:48 (Flash poster) Carbon materials, their contamination in the SEM- problem or an opportunity?
Kerry Abrams, University of Sheffield, UK


P:49 (Flash poster) Analysis of air-sensitive Li-ion battery materials
Barbara Shollock, University of Warwick, UK


P:50 (Flash poster) Pt-based chemotherapeutic quantification using HAADF STEM
Alexandra Sheader, University of Oxford, UK


P:51 (Flash poster) Quantitative comparison study of low-dose zeolite imaging using HRTEM and HAADF-STEM
Chen Huang, University of Oxford, UK


P:52 (Flash poster) Dose limited TEM and STEM characterisation of electron beam sensitive inorganic nanomaterials
Rob Hooley, University of Leeds, UK


P:53 Using transmission electron microscopy to track metal electrodeposition dynamics from nucleation and growth of a single atom to crystalline nanoparticle
Haytham E M Hussein, University of Warwick, UK

Key dates

  • Abstract submission deadline (Posters only):
    21 May 2018
  • Early registration deadline:
    8 June 2018
  • Registration deadline:
    27 June 2018